Please use this identifier to cite or link to this item: https://doi.org/10.1109/EDAPS.2010.5683003
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dc.titleEvaluation of IBIS modelling techniques for signal integrity simulations without and with package parasitics
dc.contributor.authorJi, Y.
dc.contributor.authorMouthaan, K.
dc.contributor.authorVenkatarayalu, N.V.
dc.date.accessioned2014-06-19T03:09:33Z
dc.date.available2014-06-19T03:09:33Z
dc.date.issued2010
dc.identifier.citationJi, Y.,Mouthaan, K.,Venkatarayalu, N.V. (2010). Evaluation of IBIS modelling techniques for signal integrity simulations without and with package parasitics. 2010 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2010 : -. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/EDAPS.2010.5683003" target="_blank">https://doi.org/10.1109/EDAPS.2010.5683003</a>
dc.identifier.isbn9781424490684
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/70215
dc.description.abstractInput/Output Buffer Information Specification (IBIS) models are widely used in signal integrity analysis because of their ability to protect proprietary information and to reduce simulation time when compared to full SPICE simulations. Generation of IBIS models with I/V and V/T data from a full SPICE model of a typical digital buffer without and with package parasitics is investigated in this paper. Several different IBIS model generation strategies to incorporate package effects are validated with the full SPICE model in order to provide a suitable approach. In addition, the accuracy of IBIS simulations in HSPICE and ADS is investigated.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/EDAPS.2010.5683003
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.contributor.departmentTEMASEK LABORATORIES
dc.description.doi10.1109/EDAPS.2010.5683003
dc.description.sourcetitle2010 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2010
dc.description.page-
dc.identifier.isiutNOT_IN_WOS
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