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|Title:||Advanced magnetic force microscopy for high resolution magnetic imaging||Authors:||Ranjbar, M.
Magnetic force microscopy
Perpendicular magnetic anisotropy
|Issue Date:||Jun-2012||Citation:||Ranjbar, M., Piramanayagam, S.N., Sbiaa, R., Chong, T.C., Okamoto, I. (2012-06). Advanced magnetic force microscopy for high resolution magnetic imaging. Nanoscience and Nanotechnology Letters 4 (6) : 628-633. ScholarBank@NUS Repository. https://doi.org/10.1166/nnl.2012.1367||Abstract:||Magnetic force microscopy (MFM) is one of the primary imaging tools for studying magnetic nanostructures. The resolution of MFM has been considered as a main issue in characterizing magnetic nanostructures smaller than 30 nm; especially for high density recording media beyond 1 Tbit/in2. In this letter, we investigated three different kinds of MFM tips such as those with a perpendicular magnetic anisotropy (PMA) derived from a crystallographic texture, antiferromagnetic coupled perpendicular (AFC) tips and tips with no crystallographic textures, resulting in no PMA. Their resolution, as measured using a recording media with written information, was compared with that of commercial MFM tips. The tip in the PMA configuration was found to provide the best resolution among all of them. © 2012 American Scientific Publishers.||Source Title:||Nanoscience and Nanotechnology Letters||URI:||http://scholarbank.nus.edu.sg/handle/10635/69241||ISSN:||19414900||DOI:||10.1166/nnl.2012.1367|
|Appears in Collections:||Staff Publications|
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