Please use this identifier to cite or link to this item: https://doi.org/10.1109/DELTA.2010.36
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dc.titleA smart CMOS image sensor with on-chip hot pixel correcting readout circuit for biomedical applications
dc.contributor.authorCao, Y.
dc.contributor.authorTang, F.
dc.contributor.authorBermak, A.
dc.contributor.authorLe, T.M.
dc.date.accessioned2014-06-19T02:56:35Z
dc.date.available2014-06-19T02:56:35Z
dc.date.issued2010
dc.identifier.citationCao, Y.,Tang, F.,Bermak, A.,Le, T.M. (2010). A smart CMOS image sensor with on-chip hot pixel correcting readout circuit for biomedical applications. Proceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010 : 103-107. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/DELTA.2010.36" target="_blank">https://doi.org/10.1109/DELTA.2010.36</a>
dc.identifier.isbn9780769539782
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/69077
dc.description.abstractOne of the most recent and exciting applications for CMOS image sensors is in the biomedical field. In such applications, these sensors often operate in harsh environments (high intensity, high pressure, long time exposure), which increase the probability for the occurrence of hot pixel defects over their lifetime. This paper presents a novel smart CMOS image sensor integrating hot pixel correcting readout circuit to preserve the quality of the captured images. With this approach, no. extra non-volatile memory is required in the sensor device to store the locations of the hot pixels. In addition, the reliability of the sensor is ensured by maintaining a realtime detection of hot pixels during image capture. © 2010 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/DELTA.2010.36
dc.sourceScopus
dc.subjectBiomedical applications
dc.subjectCMOS image sensor
dc.subjectHot pixel correction
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/DELTA.2010.36
dc.description.sourcetitleProceedings - 5th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2010
dc.description.page103-107
dc.identifier.isiutNOT_IN_WOS
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