Please use this identifier to cite or link to this item: https://doi.org/10.1109/TMAG.2010.2044979
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dc.titleA self-consistent SDD-NEGF approach for modelling magnetic tunnel junctions
dc.contributor.authorSiu, Z.B.
dc.contributor.authorJalil, M.B.A.
dc.contributor.authorTan, S.G.
dc.contributor.authorWang, J.-S.
dc.date.accessioned2014-06-19T02:56:23Z
dc.date.available2014-06-19T02:56:23Z
dc.date.issued2010-06
dc.identifier.citationSiu, Z.B., Jalil, M.B.A., Tan, S.G., Wang, J.-S. (2010-06). A self-consistent SDD-NEGF approach for modelling magnetic tunnel junctions. IEEE Transactions on Magnetics 46 (6) : 1591-1594. ScholarBank@NUS Repository. https://doi.org/10.1109/TMAG.2010.2044979
dc.identifier.issn00189464
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/69060
dc.description.abstractMost contemporary work on magnetic tunnel junctions either consider ballistic quantum transport across the tunneling barrer, for instance via the Non Equilibrium Green's Function (NEGF) formalism, or treat the tunneling region as a lump resistance connected to bulk metallic leads in the Spin Drift-Diffusion (SDD) approach. The effects of interfacial barriers and central device physics on the spin accumlation in the leads have largely been ignored in most NEGF calculations. In this work we introduce a self consistent approach that combines the NEGF and SDD methods. We calculate the effects of the barrier potential height and spin orbit interaction on the spin injection from a ferromagnet to a semiconductor through the barrier. © 2006 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TMAG.2010.2044979
dc.sourceScopus
dc.subjectMagnetic tunnel junctions
dc.subjectNon-equilibrium Green's function
dc.subjectSpin diffusion drift
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.contributor.departmentPHYSICS
dc.description.doi10.1109/TMAG.2010.2044979
dc.description.sourcetitleIEEE Transactions on Magnetics
dc.description.volume46
dc.description.issue6
dc.description.page1591-1594
dc.description.codenIEMGA
dc.identifier.isiut000278037800080
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