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|Title:||Comment on "theoretical analysis of numerical aperture increasing lens microscopy" [ J. Appl. Phys.97, 053105 (2005)]||Authors:||Sheppard, C.J.R.
|Issue Date:||2006||Citation:||Sheppard, C.J.R., Huat, G.S. (2006). Comment on "theoretical analysis of numerical aperture increasing lens microscopy" [ J. Appl. Phys.97, 053105 (2005)]. Journal of Applied Physics 100 (8) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.2359621||Abstract:||In a recent paper, Ippolito [J. Appl. Phys. 97, 053105 (2005)] analyzed focusing at high numerical aperture into a dielectric medium. They considered three geometries, those of focusing through a level planar interface and through spherical interfaces arranged in concentric or aplanatic positions. The treatment for focusing through a planar interface is based on a different model from that presented elsewhere. It is shown that this model describes the aberration effect only approximately, in contrast to the previous, rigorous treatment. © 2006 American Institute of Physics.||Source Title:||Journal of Applied Physics||URI:||http://scholarbank.nus.edu.sg/handle/10635/68173||ISSN:||00218979||DOI:||10.1063/1.2359621|
|Appears in Collections:||Staff Publications|
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