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|Title:||Cantilever deflection profile in scanning probe microscopy||Authors:||Ng, T.W.
|Issue Date:||1-Jul-2006||Citation:||Ng, T.W., Thirunavukkarasu, S. (2006-07-01). Cantilever deflection profile in scanning probe microscopy. European Journal of Physics 27 (4) : 969-973. ScholarBank@NUS Repository. https://doi.org/10.1088/0143-0807/27/4/027||Abstract:||Experiments that illustrate the operation of scanning probe microscopes are pedagogically beneficial. Here, we describe an experiment that allows students to view the deflection profile of a scanning probe cantilever as a concentrated vertical force is applied at its probe tip. The profile was found to adhere closely to the manner described in the elastic theory of classical mechanics. This simple experiment offers students an invaluable insight into the mechanics of scanning probe microscopy. More importantly, it can be performed easily and economically. © 2006 IOP Publishing Ltd.||Source Title:||European Journal of Physics||URI:||http://scholarbank.nus.edu.sg/handle/10635/67748||ISSN:||01430807||DOI:||10.1088/0143-0807/27/4/027|
|Appears in Collections:||Staff Publications|
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