1. ScholarBank@NUS
  2. 1. Staff
  3. Staff Publications
Please use this identifier to cite or link to this item: https://doi.org/10.1364/AO.48.006290
DC FieldValue
dc.titleEdge enhancement for in-phase focal modulation microscope
dc.contributor.authorSi, K.
dc.contributor.authorGong, W.
dc.contributor.authorChen, N.
dc.contributor.authorSheppard, C.J.R.
dc.date.accessioned2014-06-17T09:43:23Z
dc.date.available2014-06-17T09:43:23Z
dc.date.issued2009-11-10
dc.identifier.citationSi, K., Gong, W., Chen, N., Sheppard, C.J.R. (2009-11-10). Edge enhancement for in-phase focal modulation microscope. Applied Optics 48 (32) : 6290-6295. ScholarBank@NUS Repository. https://doi.org/10.1364/AO.48.006290
dc.identifier.issn00036935
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/67012
dc.description.abstractIn-phase focal modulation microscopy (IPFMM) with single photon excited fluorescence is presented. Optical transfer functions and images of thin and thick fluorescent edges in IPFMM are investigated. The results show that, compared with confocal microscopy, using IPFMM can result in a sharper image of the edge, and the edge gradient can be increased up to 75.4% and 58.9% for a thick edge and a thin edge, respectively. Signal level is also discussed, and the results show that, to obtain high transverse resolution with IPFMM, the normalized detector pinhole radius should not exceed 2.8. © 2009 Optical Society of America.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1364/AO.48.006290
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentBIOENGINEERING
dc.description.doi10.1364/AO.48.006290
dc.description.sourcetitleApplied Optics
dc.description.volume48
dc.description.issue32
dc.description.page6290-6295
dc.description.codenAPOPA
dc.identifier.isiut000271649700028
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.