Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.nimb.2007.02.112
DC FieldValue
dc.titleThe rapid secondary electron imaging system of the proton beam writer at CIBA
dc.contributor.authorUdalagama, C.N.B.
dc.contributor.authorBettiol, A.A.
dc.contributor.authorvan Kan, J.A.
dc.contributor.authorTeo, E.J.
dc.contributor.authorWatt, F.
dc.date.accessioned2014-06-17T08:00:28Z
dc.date.available2014-06-17T08:00:28Z
dc.date.issued2007-07
dc.identifier.citationUdalagama, C.N.B., Bettiol, A.A., van Kan, J.A., Teo, E.J., Watt, F. (2007-07). The rapid secondary electron imaging system of the proton beam writer at CIBA. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms 260 (1) : 390-395. ScholarBank@NUS Repository. https://doi.org/10.1016/j.nimb.2007.02.112
dc.identifier.issn0168583X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/65042
dc.description.abstractThe recent years have witnessed a proliferation of research involving proton beam (p-beam) writing. This has prompted investigations into means of optimizing the process of p-beam writing so as to make it less time consuming and more efficient. One such avenue is the improvement of the pre-writing preparatory procedures that involves beam focusing and sample alignment which is centred on acquiring images of a resolution standard or sample. The conventional mode of imaging used up to now has utilized conventional nuclear microprobe signals that are of a pulsed nature and are inherently slow. In this work, we report the new imaging system that has been introduced, which uses proton induced secondary electrons. This in conjunction with software developed in-house that uses a National Instruments DAQ card with hardware triggering, facilitates large data transfer rates enabling rapid imaging. Frame rates as much as 10 frames/s have been achieved at an imaging resolution of 512 × 512 pixels. © 2007 Elsevier B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.nimb.2007.02.112
dc.sourceScopus
dc.subjectData acquisition
dc.subjectp-Beam writing
dc.subjectRapid imaging
dc.subjectSecondary electrons
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.contributor.departmentMATERIALS SCIENCE AND ENGINEERING
dc.description.doi10.1016/j.nimb.2007.02.112
dc.description.sourcetitleNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
dc.description.volume260
dc.description.issue1
dc.description.page390-395
dc.description.codenNIMBE
dc.identifier.isiut000248264900075
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