Please use this identifier to cite or link to this item:
https://scholarbank.nus.edu.sg/handle/10635/63258
DC Field | Value | |
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dc.title | Planning accelerated life tests under scheduled inspections for log-location-scale distributions | |
dc.contributor.author | Liu, X. | |
dc.contributor.author | Tang, L.-C. | |
dc.date.accessioned | 2014-06-17T07:01:59Z | |
dc.date.available | 2014-06-17T07:01:59Z | |
dc.date.issued | 2013 | |
dc.identifier.citation | Liu, X., Tang, L.-C. (2013). Planning accelerated life tests under scheduled inspections for log-location-scale distributions. IEEE Transactions on Reliability 62 (2) : 515-526. ScholarBank@NUS Repository. | |
dc.identifier.issn | 00189529 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/63258 | |
dc.description.abstract | This paper proposes an efficient approach to planning an ALT under scheduled inspections. We aim to simultaneously optimize stress levels, sample allocation, and inspection times for lifetimes that follow log-location-scale life distributions, including Weibull and Lognormal distributions. Such a high-dimension optimization problem is solved by a computationally efficient approach leveraging on the asymptotic equivalence between the selection of sample quantiles for parameter estimation of a location-scale distribution and the selection of the optimal inspection times during an ALT for the same purpose. A numerical example is presented to illustrate the application of the proposed approach, and a sensitivity analysis is performed to investigate the robustness of the optimal ALT plans against misspecification of planning inputs. A computer program coded in the MATLAB Graphical User Interface Design Environment is provided to make our method readily applicable in practice. © 2012 IEEE. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TR.2013.2255792 | |
dc.source | Scopus | |
dc.subject | Accelerated life test | |
dc.subject | design of experiments | |
dc.subject | optimal spacing | |
dc.subject | scheduled inspections | |
dc.type | Article | |
dc.contributor.department | INDUSTRIAL & SYSTEMS ENGINEERING | |
dc.description.sourcetitle | IEEE Transactions on Reliability | |
dc.description.volume | 62 | |
dc.description.issue | 2 | |
dc.description.page | 515-526 | |
dc.description.coden | IEERA | |
dc.identifier.isiut | 000319750500019 | |
Appears in Collections: | Staff Publications |
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