Please use this identifier to cite or link to this item: https://doi.org/10.1109/TR.2010.2040772
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dc.titleNonparametric estimation of decreasing mean residual life with type II censored data
dc.contributor.authorShen, Y.
dc.contributor.authorXie, M.
dc.contributor.authorTang, L.C.
dc.date.accessioned2014-06-17T07:01:24Z
dc.date.available2014-06-17T07:01:24Z
dc.date.issued2010
dc.identifier.citationShen, Y., Xie, M., Tang, L.C. (2010). Nonparametric estimation of decreasing mean residual life with type II censored data. IEEE Transactions on Reliability 59 (1) : 38-44. ScholarBank@NUS Repository. https://doi.org/10.1109/TR.2010.2040772
dc.identifier.issn00189529
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/63206
dc.description.abstractIn this paper, a nonparametric method is proposed for the estimation of decreasing mean residual life with type II censored data. This method is based on the comparison between two estimators of the reliability function: the Kaplan-Meier estimator, and an estimator derived from the empirical MRL function. Simulation results indicate that the new approach is able to give good performance, and can outperform some existing parametric methods when censoring is heavy. © 2010 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TR.2010.2040772
dc.sourceScopus
dc.subjectDecreasing mean residual life
dc.subjectNonparametric estimation
dc.subjectType II censoring
dc.typeArticle
dc.contributor.departmentINDUSTRIAL & SYSTEMS ENGINEERING
dc.description.doi10.1109/TR.2010.2040772
dc.description.sourcetitleIEEE Transactions on Reliability
dc.description.volume59
dc.description.issue1
dc.description.page38-44
dc.description.codenIEERA
dc.identifier.isiut000278618100005
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