Please use this identifier to cite or link to this item: https://doi.org/10.1109/24.488919
DC FieldValue
dc.titleAnalysis of step-stress accelerated-life-test data: a new approach
dc.contributor.authorTang, L.C.
dc.contributor.authorSun, Y.S.
dc.contributor.authorGoh, T.N.
dc.contributor.authorOng, H.L.
dc.date.accessioned2014-06-17T06:59:17Z
dc.date.available2014-06-17T06:59:17Z
dc.date.issued1996
dc.identifier.citationTang, L.C., Sun, Y.S., Goh, T.N., Ong, H.L. (1996). Analysis of step-stress accelerated-life-test data: a new approach. IEEE Transactions on Reliability 45 (1) : 69-74. ScholarBank@NUS Repository. https://doi.org/10.1109/24.488919
dc.identifier.issn00189529
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/63025
dc.description.abstractA linear cumulative exposure model (LCEM) is used to analyze data from a step-stress accelerated-life-test, in particular, those with failure-free life (FFL). FFL is characterized by a location parameter in the distribution. For the 2-parameter Weibull distribution, the Nelson cumulative exposure model is a special case of LCEM. Under LCEM a general expression is derived for computing the MLE of stress-dependent distribution parameters under multiple censoring. The estimation procedure is simple and is illustrated by a set of experimental data using the 3-parameter Weibull distribution. © 1996 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/24.488919
dc.sourceScopus
dc.subjectAccelerated life test
dc.subjectCumulative exposure model
dc.subjectMaximum likelihood estimator (mle)
dc.subjectStep-stress
dc.subjectWeibull distribution
dc.typeArticle
dc.contributor.departmentINDUSTRIAL & SYSTEMS ENGINEERING
dc.description.doi10.1109/24.488919
dc.description.sourcetitleIEEE Transactions on Reliability
dc.description.volume45
dc.description.issue1
dc.description.page69-74
dc.description.codenIEERA
dc.identifier.isiutA1996UG99300018
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