Please use this identifier to cite or link to this item:
https://doi.org/10.1109/24.488919
DC Field | Value | |
---|---|---|
dc.title | Analysis of step-stress accelerated-life-test data: a new approach | |
dc.contributor.author | Tang, L.C. | |
dc.contributor.author | Sun, Y.S. | |
dc.contributor.author | Goh, T.N. | |
dc.contributor.author | Ong, H.L. | |
dc.date.accessioned | 2014-06-17T06:59:17Z | |
dc.date.available | 2014-06-17T06:59:17Z | |
dc.date.issued | 1996 | |
dc.identifier.citation | Tang, L.C., Sun, Y.S., Goh, T.N., Ong, H.L. (1996). Analysis of step-stress accelerated-life-test data: a new approach. IEEE Transactions on Reliability 45 (1) : 69-74. ScholarBank@NUS Repository. https://doi.org/10.1109/24.488919 | |
dc.identifier.issn | 00189529 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/63025 | |
dc.description.abstract | A linear cumulative exposure model (LCEM) is used to analyze data from a step-stress accelerated-life-test, in particular, those with failure-free life (FFL). FFL is characterized by a location parameter in the distribution. For the 2-parameter Weibull distribution, the Nelson cumulative exposure model is a special case of LCEM. Under LCEM a general expression is derived for computing the MLE of stress-dependent distribution parameters under multiple censoring. The estimation procedure is simple and is illustrated by a set of experimental data using the 3-parameter Weibull distribution. © 1996 IEEE. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/24.488919 | |
dc.source | Scopus | |
dc.subject | Accelerated life test | |
dc.subject | Cumulative exposure model | |
dc.subject | Maximum likelihood estimator (mle) | |
dc.subject | Step-stress | |
dc.subject | Weibull distribution | |
dc.type | Article | |
dc.contributor.department | INDUSTRIAL & SYSTEMS ENGINEERING | |
dc.description.doi | 10.1109/24.488919 | |
dc.description.sourcetitle | IEEE Transactions on Reliability | |
dc.description.volume | 45 | |
dc.description.issue | 1 | |
dc.description.page | 69-74 | |
dc.description.coden | IEERA | |
dc.identifier.isiut | A1996UG99300018 | |
Appears in Collections: | Staff Publications |
Show simple item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.