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Title: Analysis of step-stress accelerated-life-test data: a new approach
Authors: Tang, L.C. 
Sun, Y.S.
Goh, T.N. 
Ong, H.L. 
Keywords: Accelerated life test
Cumulative exposure model
Maximum likelihood estimator (mle)
Weibull distribution
Issue Date: 1996
Citation: Tang, L.C., Sun, Y.S., Goh, T.N., Ong, H.L. (1996). Analysis of step-stress accelerated-life-test data: a new approach. IEEE Transactions on Reliability 45 (1) : 69-74. ScholarBank@NUS Repository.
Abstract: A linear cumulative exposure model (LCEM) is used to analyze data from a step-stress accelerated-life-test, in particular, those with failure-free life (FFL). FFL is characterized by a location parameter in the distribution. For the 2-parameter Weibull distribution, the Nelson cumulative exposure model is a special case of LCEM. Under LCEM a general expression is derived for computing the MLE of stress-dependent distribution parameters under multiple censoring. The estimation procedure is simple and is illustrated by a set of experimental data using the 3-parameter Weibull distribution. © 1996 IEEE.
Source Title: IEEE Transactions on Reliability
ISSN: 00189529
DOI: 10.1109/24.488919
Appears in Collections:Staff Publications

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