Please use this identifier to cite or link to this item:
|Title:||Analysis of step-stress accelerated-life-test data: a new approach||Authors:||Tang, L.C.
|Keywords:||Accelerated life test
Cumulative exposure model
Maximum likelihood estimator (mle)
|Issue Date:||1996||Citation:||Tang, L.C., Sun, Y.S., Goh, T.N., Ong, H.L. (1996). Analysis of step-stress accelerated-life-test data: a new approach. IEEE Transactions on Reliability 45 (1) : 69-74. ScholarBank@NUS Repository. https://doi.org/10.1109/24.488919||Abstract:||A linear cumulative exposure model (LCEM) is used to analyze data from a step-stress accelerated-life-test, in particular, those with failure-free life (FFL). FFL is characterized by a location parameter in the distribution. For the 2-parameter Weibull distribution, the Nelson cumulative exposure model is a special case of LCEM. Under LCEM a general expression is derived for computing the MLE of stress-dependent distribution parameters under multiple censoring. The estimation procedure is simple and is illustrated by a set of experimental data using the 3-parameter Weibull distribution. © 1996 IEEE.||Source Title:||IEEE Transactions on Reliability||URI:||http://scholarbank.nus.edu.sg/handle/10635/63025||ISSN:||00189529||DOI:||10.1109/24.488919|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.