Please use this identifier to cite or link to this item: https://doi.org/10.1109/TSE.2003.1199075
DC FieldValue
dc.titleA study of the effect of imperfect debugging on software development cost
dc.contributor.authorXie, M.
dc.contributor.authorYang, B.
dc.date.accessioned2014-06-17T06:58:34Z
dc.date.available2014-06-17T06:58:34Z
dc.date.issued2003-05
dc.identifier.citationXie, M., Yang, B. (2003-05). A study of the effect of imperfect debugging on software development cost. IEEE Transactions on Software Engineering 29 (5) : 471-473. ScholarBank@NUS Repository. https://doi.org/10.1109/TSE.2003.1199075
dc.identifier.issn00985589
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/62963
dc.description.abstractIt is widely recognized that the debugging processes are usually imperfect. Software faults are not completely removed because of the difficulty in locating them or because new faults might be introduced. Hence, it is of great importance to investigate the effect of the imperfect debugging on software development cost, which, in turn, might affect the optimal software release time or operational budget. In this paper, a commonly used cost model is extended to the case of imperfect debugging. Based on this, the effect of imperfect debugging is studied. As the probability of perfect debugging, termed testing level here, is expensive to be increased, but manageable to a certain extent with additional resources, a model incorporating this situation is presented. Moreover, the problem of determining the optimal testing level is considered. This is useful when the decisions regarding the test team composition, testing strategy, etc., are to be made for more effective testing.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TSE.2003.1199075
dc.sourceScopus
dc.subjectDevelopment cost
dc.subjectImperfect debugging
dc.subjectSoftware reliability
dc.subjectTesting level
dc.subjectTesting optimization
dc.typeArticle
dc.contributor.departmentINDUSTRIAL & SYSTEMS ENGINEERING
dc.description.doi10.1109/TSE.2003.1199075
dc.description.sourcetitleIEEE Transactions on Software Engineering
dc.description.volume29
dc.description.issue5
dc.description.page471-473
dc.description.codenIESED
dc.identifier.isiut000182688000007
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