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Title: Microcracks of the alumina of the thin-film head: study and simulation
Authors: Chekanov, A.S. 
Low, T.S. 
Alli, S. 
Liu, B. 
Teo, B.S. 
Hu, S. 
Issue Date: Nov-1995
Citation: Chekanov, A.S., Low, T.S., Alli, S., Liu, B., Teo, B.S., Hu, S. (1995-11). Microcracks of the alumina of the thin-film head: study and simulation. IEEE Transactions on Magnetics 31 (6 pt 1) : 2991-2993. ScholarBank@NUS Repository.
Abstract: A study of the microcracks found in the alumina of the magnetic thin film head is presented. A model of the alumina fatigue crack initiation and growth is proposed. Thermal expansion of the energized wires leads to high stress at the pole tip area. Crack initiation usually occurs at the outer edge of the alumina, due to the mechanical damages caused by the rotating disk surface. Further crack growth is caused by fatigue in the alumina. The crack is attracted to the pole tip area, affecting the magnetic head performance. Magnetic Force Microscopy was used to study the effects of the crack on the magnetic fringe field of the head.
Source Title: IEEE Transactions on Magnetics
ISSN: 00189464
Appears in Collections:Staff Publications

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