Please use this identifier to cite or link to this item:
|Title:||Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures||Authors:||Ling, C.H.
|Issue Date:||Sep-1986||Citation:||Ling, C.H.,Kwok, C.Y.,Chan, E.G.,Tay, T.M. (1986-09). Frequency dependence of MOS capacitance in strong inversion and at elevated temperatures. Solid State Electronics 29 (9) : 995-997. ScholarBank@NUS Repository.||Source Title:||Solid State Electronics||URI:||http://scholarbank.nus.edu.sg/handle/10635/62214||ISSN:||00381101|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Sep 22, 2022
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.