Please use this identifier to cite or link to this item: https://doi.org/10.1109/26.297838
DC FieldValue
dc.titleError probability of 2DPSK with phase noise
dc.contributor.authorKam, Pooi Yuen
dc.contributor.authorSeek, Kwai Yin
dc.contributor.authorTjhung, Tjeng Thiang
dc.contributor.authorSinha, Pranesh
dc.date.accessioned2014-06-17T06:47:56Z
dc.date.available2014-06-17T06:47:56Z
dc.date.issued1994-07
dc.identifier.citationKam, Pooi Yuen,Seek, Kwai Yin,Tjhung, Tjeng Thiang,Sinha, Pranesh (1994-07). Error probability of 2DPSK with phase noise. IEEE Transactions on Communications 42 (7) : 2366-2369. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/26.297838" target="_blank">https://doi.org/10.1109/26.297838</a>
dc.identifier.issn00906778
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/62150
dc.description.abstractA simple tight upper bound on the BEP of 2DPSK over the AWGN channel with phase noise in the received signal is obtained. The phase is modeled as a Gaussian random process which is slowly varying compared to the bit rate so that a piecewise-constant approximation can be made. The bound is verified by computer simulations, and it provides good estimates of the error probability. It shows that for high SNR the error probability decreases as the reciprocal of the square-root of the SNR. The results are applicable in particular to heterodyne optical communications.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/26.297838
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL ENGINEERING
dc.contributor.departmentINSTITUTE OF MICROELECTRONICS
dc.description.doi10.1109/26.297838
dc.description.sourcetitleIEEE Transactions on Communications
dc.description.volume42
dc.description.issue7
dc.description.page2366-2369
dc.description.codenIECMB
dc.identifier.isiutNOT_IN_WOS
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