Please use this identifier to cite or link to this item:
|Title:||Vapor pressure and residual stress effects on failure of an adhesive film||Authors:||Chew, H.B.
|Issue Date:||Aug-2005||Citation:||Chew, H.B., Guo, T.F., Cheng, L. (2005-08). Vapor pressure and residual stress effects on failure of an adhesive film. International Journal of Solids and Structures 42 (16-17) : 4795-4810. ScholarBank@NUS Repository. https://doi.org/10.1016/j.ijsolstr.2005.01.012||Abstract:||Surface-mount plastic encapsulated microcircuits (PEM) are susceptible to temperature- and moisture-induced failures during reflow soldering. Adhesive failures in PEMs are studied using a model problem of a ductile adhesive joining two elastic substrates. The polymeric adhesive contains a centerline crack. The adhesive film is stressed by remote loading and residual stresses. Voids in the adhesive are pressurized by rapidly expanding water vapor. The computational study addresses three competing failure mechanisms: (i) extended contiguous damage zone emanating from the crack; (ii) multiple damage zones forming at distances of several film thicknesses ahead of the crack; and (iii) extensive damage developing along film-substrate interfaces. The second failure mechanism is found in low porosity adhesives, while the first is dominant in high porosity adhesives. The first is also the likely failure mode when voids in the adhesive are subjected to high vapor pressure. The third damage mechanism is operative in low porosity adhesives subjected to high residual stress. In general, both residual stress and vapor pressure exert pronounced effects on failure modes. Vapor pressure, in particular, accelerates voiding activity and growth of the damage zone offering insights into the catastrophic nature of popcorn cracking. © 2005 Elsevier Ltd. All rights reserved.||Source Title:||International Journal of Solids and Structures||URI:||http://scholarbank.nus.edu.sg/handle/10635/61660||ISSN:||00207683||DOI:||10.1016/j.ijsolstr.2005.01.012|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Oct 26, 2020
WEB OF SCIENCETM
checked on Oct 26, 2020
checked on Oct 24, 2020
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.