Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/61534
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dc.titleThe use of carrier fringes and FFT in holographic nondestructive testing
dc.contributor.authorQuan, C.
dc.contributor.authorTay, C.J.
dc.contributor.authorShang, H.M.
dc.date.accessioned2014-06-17T06:36:18Z
dc.date.available2014-06-17T06:36:18Z
dc.date.issued2001-07
dc.identifier.citationQuan, C.,Tay, C.J.,Shang, H.M. (2001-07). The use of carrier fringes and FFT in holographic nondestructive testing. Experimental Techniques 25 (4) : 35-38. ScholarBank@NUS Repository.
dc.identifier.issn07328818
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/61534
dc.description.abstractThe carrier fringe technique for holographic interferometry was discussed. The use of fast Fourier transforms (FFT) in the method enabled phase measurement from fringe patterns caused due to interference of tilted wavefronts. The FFT approach was used to extract deformation information automatically from complex interferograms and was shown to have considerable potential for solving images in its ability to extract data in the presence of pixel noise.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentMECHANICAL ENGINEERING
dc.description.sourcetitleExperimental Techniques
dc.description.volume25
dc.description.issue4
dc.description.page35-38
dc.description.codenEXPTD
dc.identifier.isiutNOT_IN_WOS
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