Please use this identifier to cite or link to this item:
https://doi.org/10.1109/LPT.2013.2258665
DC Field | Value | |
---|---|---|
dc.title | Post-corrections of image distortions in a scanning grating-based spectral line imager | |
dc.contributor.author | Cheo, K.K.L. | |
dc.contributor.author | Du, Y. | |
dc.contributor.author | Zhou, G. | |
dc.contributor.author | Chau, F.S. | |
dc.date.accessioned | 2014-06-17T06:31:22Z | |
dc.date.available | 2014-06-17T06:31:22Z | |
dc.date.issued | 2013 | |
dc.identifier.citation | Cheo, K.K.L., Du, Y., Zhou, G., Chau, F.S. (2013). Post-corrections of image distortions in a scanning grating-based spectral line imager. IEEE Photonics Technology Letters 25 (12) : 1103-1106. ScholarBank@NUS Repository. https://doi.org/10.1109/LPT.2013.2258665 | |
dc.identifier.issn | 10411135 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/61129 | |
dc.description.abstract | In this letter, a post-correction algorithm, which is capable of compensating typical image distortions in a scanning grating-based spectral line imager, is presented in detail. A prototype spectral line imager with a single-pixel detector is built for demonstration purposes. A double-layered vibratory grating scanner and a galvano-scanning mirror are utilized in the imager for fast spatial scanning and slow spectral scanning, respectively. There are three major imager distortions exist in the prototype system, which are spatial smile distortion, spectral keystone distortion, and nonuniform sampled spatial positions due to resonant spatial scanning. They are then corrected using a post-correction algorithm, which is based on reverse ray-tracing and Delaunay Triangulation mapping. The scanning grating-based spectral imager with the post-correction algorithm has the potential to achieve low-cost, small form-factor, and high-speed operation. © 1989-2012 IEEE. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/LPT.2013.2258665 | |
dc.source | Scopus | |
dc.subject | Grating scanner | |
dc.subject | laser scanning | |
dc.subject | line imager | |
dc.subject | microelectromechanical system (MEMS) | |
dc.subject | spectral imaging | |
dc.type | Article | |
dc.contributor.department | MECHANICAL ENGINEERING | |
dc.description.doi | 10.1109/LPT.2013.2258665 | |
dc.description.sourcetitle | IEEE Photonics Technology Letters | |
dc.description.volume | 25 | |
dc.description.issue | 12 | |
dc.description.page | 1103-1106 | |
dc.description.coden | IPTLE | |
dc.identifier.isiut | 000319995900004 | |
Appears in Collections: | Staff Publications |
Show simple item record
Files in This Item:
There are no files associated with this item.
SCOPUSTM
Citations
3
checked on Mar 1, 2021
WEB OF SCIENCETM
Citations
3
checked on Mar 1, 2021
Page view(s)
64
checked on Mar 1, 2021
Google ScholarTM
Check
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.