Please use this identifier to cite or link to this item: https://doi.org/10.1364/AO.44.001393
Title: Grating projection system for surface contour measurement
Authors: Tay, C.J. 
Thakur, M. 
Quan, C. 
Issue Date: 10-Mar-2005
Citation: Tay, C.J., Thakur, M., Quan, C. (2005-03-10). Grating projection system for surface contour measurement. Applied Optics 44 (8) : 1393-1400. ScholarBank@NUS Repository. https://doi.org/10.1364/AO.44.001393
Abstract: A grating projection system is a low-cost surface contour measurement technique that can be applied to a wide range of applications. There has been a resurgence of interest in the technique in recent years because of developments in computer hardware and image processing algorithms. We describe a method that projects a phase-shifted grating through a lens on an object surface. The deformed grating image on the object surface is captured by a CCD camera for subsequent analysis. Phase variation is achieved by a linear translation stage on which the grating is mounted. We compare the experimental results with the test results using a mechanical stylus method. © 2005 Optical Society of America.
Source Title: Applied Optics
URI: http://scholarbank.nus.edu.sg/handle/10635/60418
ISSN: 00036935
DOI: 10.1364/AO.44.001393
Appears in Collections:Staff Publications

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