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|Title:||The crack growth resistance of polyimide film||Authors:||Cotterell, B.
|Issue Date:||1996||Citation:||Cotterell, B.,Sim, M.C.,Amrutharaj, G.,Teoh, S.H. (1996). The crack growth resistance of polyimide film. Journal of Materials Science 31 (2) : 291-295. ScholarBank@NUS Repository.||Abstract:||The crack growth resistance of Dupont Kapton film is measured using the constrained short centre-notched tension specimen that is clamped along its loaded edge. Poisson's effect induces a lateral tension on the specimen which eliminates the buckling problems associated with standard fracture tests. Polyimide film is shown to possess considerable crack growth resistance that decreases slightly with film thickness. SEM examination reveals the likely cause of the crack growth resistance to be cold drawing behind the crack tip. © 1996 Chapman & Hall.||Source Title:||Journal of Materials Science||URI:||http://scholarbank.nus.edu.sg/handle/10635/58784||ISSN:||00222461|
|Appears in Collections:||Staff Publications|
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