Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/58378
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dc.titleImproved spatial phase detection for profilometry using a TDI imager
dc.contributor.authorSajan, M.R.
dc.contributor.authorTay, C.J.
dc.contributor.authorShang, H.M.
dc.contributor.authorAsundi, A.
dc.date.accessioned2014-06-17T05:13:53Z
dc.date.available2014-06-17T05:13:53Z
dc.date.issued1998-05-01
dc.identifier.citationSajan, M.R.,Tay, C.J.,Shang, H.M.,Asundi, A. (1998-05-01). Improved spatial phase detection for profilometry using a TDI imager. Optics Communications 150 (1-6) : 66-70. ScholarBank@NUS Repository.
dc.identifier.issn00304018
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/58378
dc.description.abstractPerformance of a time delay and integration (TDI) imager is analogous to a drum/periphery camera. Coupled to a modulated line generating laser diode, it is possible to use a TDI imager to encode the shape profile of a rotating cylindrical object as deformed gratings in a digital image. Among the various methods for extracting the phase from a deformed grating, the spatial phase detection (SPD) method is fast and easy to use. Errors are introduced in this method if the phase gradient is high over a grating interval. Here we propose a method to reduce the phase gradient by using a TDI feature which makes it possible to record images at variable lateral magnification. © 1998 Published by Elsevier Science B.V. All rights reserved.
dc.sourceScopus
dc.subjectDigital imaging
dc.subjectDynamic imaging
dc.subjectMoiré
dc.subjectOptical inspection
dc.subjectProfilometry
dc.subjectTDI
dc.typeArticle
dc.contributor.departmentMECHANICAL & PRODUCTION ENGINEERING
dc.description.sourcetitleOptics Communications
dc.description.volume150
dc.description.issue1-6
dc.description.page66-70
dc.description.codenOPCOB
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

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