Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3626854
DC FieldValue
dc.titleThe role of charge traps in inducing hysteresis: Capacitance-voltage measurements on top gated bilayer graphene
dc.contributor.authorKalon, G.
dc.contributor.authorJun Shin, Y.
dc.contributor.authorGiang Truong, V.
dc.contributor.authorKalitsov, A.
dc.contributor.authorYang, H.
dc.date.accessioned2014-06-17T03:08:26Z
dc.date.available2014-06-17T03:08:26Z
dc.date.issued2011-08-22
dc.identifier.citationKalon, G., Jun Shin, Y., Giang Truong, V., Kalitsov, A., Yang, H. (2011-08-22). The role of charge traps in inducing hysteresis: Capacitance-voltage measurements on top gated bilayer graphene. Applied Physics Letters 99 (8) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3626854
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/57634
dc.description.abstractUnderstanding the origin of hysteresis in the channel resistance from top gated graphene transistors is important for transistor applications. Capacitance-voltage measurements across the gate oxide on top gated bilayer graphene show hysteresis with a charging and discharging time constant of ∼100 s. However, the measured capacitance across the graphene channel does not show any hysteresis but shows an abrupt jump at a high channel voltage due to the emergence of an order, indicating that the origin of hysteresis between gate and source is due to charge traps present in the gate oxide and graphene interface. © 2011 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3626854
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.3626854
dc.description.sourcetitleApplied Physics Letters
dc.description.volume99
dc.description.issue8
dc.description.page-
dc.description.codenAPPLA
dc.identifier.isiut000294359100066
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

54
checked on Jun 10, 2021

WEB OF SCIENCETM
Citations

54
checked on Jun 3, 2021

Page view(s)

103
checked on Jun 10, 2021

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.