Please use this identifier to cite or link to this item: https://doi.org/10.1109/MCD.2005.1388766
DC FieldValue
dc.titleThe power of functional scaling: Beyond the power consumption challenge and the scaling roadmap
dc.contributor.authorChin, A.
dc.contributor.authorMcAlister, S.P.
dc.date.accessioned2014-06-17T03:08:25Z
dc.date.available2014-06-17T03:08:25Z
dc.date.issued2005-01
dc.identifier.citationChin, A., McAlister, S.P. (2005-01). The power of functional scaling: Beyond the power consumption challenge and the scaling roadmap. IEEE Circuits and Devices Magazine 21 (1) : 27-35. ScholarBank@NUS Repository. https://doi.org/10.1109/MCD.2005.1388766
dc.identifier.issn87553996
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/57632
dc.description.abstractThe increases in the densities of devices and their functionality in circuits are making the issue of power dissipation, both static and dynamic, a serious constraint to future scaling advances. 3-D integration of novel Ge-based devices with standard Si devices is shown to provide potential ways to address the dc and ac power consumption issues in advanced ICs. Advantages of this scheme include low processing temperature and excellent lattice-match with GaAs.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/MCD.2005.1388766
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/MCD.2005.1388766
dc.description.sourcetitleIEEE Circuits and Devices Magazine
dc.description.volume21
dc.description.issue1
dc.description.page27-35
dc.description.codenICDME
dc.identifier.isiut000227072100004
Appears in Collections:Staff Publications

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