Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1763984
DC FieldValue
dc.titleScanning electron microscopy of field-emitting individual single-walled carbon nanotubes
dc.contributor.authorNojeh, A.
dc.contributor.authorWong, W.-K.
dc.contributor.authorBaum, A.W.
dc.contributor.authorPease, R.F.
dc.contributor.authorDai, H.
dc.date.accessioned2014-06-17T03:04:58Z
dc.date.available2014-06-17T03:04:58Z
dc.date.issued2004-07-05
dc.identifier.citationNojeh, A., Wong, W.-K., Baum, A.W., Pease, R.F., Dai, H. (2004-07-05). Scanning electron microscopy of field-emitting individual single-walled carbon nanotubes. Applied Physics Letters 85 (1) : 112-114. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1763984
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/57332
dc.description.abstractThe use of scanning electron microscope (SEM) to view the emission from individual single-walled carbon nanotubes (SWCNT) by applying an external field close to the onset of field-emission and then scanning the tube with the electron beam of the SEM was demonstrated. The SWCNT were grown by using chemical vapor depositon (CVD) for 5 min at 850°C with methane and ethylene as precursors and hydrogen as a background gas. It was observed that at the onset of emission, the SEM image did indeed, as speculated, exhibit a few bright spots corresponding to the positions of the CNT tips. Black radial patterns emanating from the emission point toward the extractor electrode were also observed.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1763984
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.1763984
dc.description.sourcetitleApplied Physics Letters
dc.description.volume85
dc.description.issue1
dc.description.page112-114
dc.description.codenAPPLA
dc.identifier.isiut000222360300038
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