Probing layer number and stacking order of few-layer graphene by Raman Spectroscopy

Abstract

Layer number and stacking order of few-layer graphene (FLG) are of particular interest since they directly determine the performance of graphenebased electronic devices. By analyzing Raman spectra and Raman images, quantitative indices are extracted to discriminate the thickness of ABstacked FLG from single- to five-layer graphene; a few key spectral characteristics are also identified for FLG with misoriented stacking electronic structure graphene, Raman spectroscopy, stacking. © 2010 Wlley-VCH Verlag GmbH & Co. KGaA.