Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.4803048
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dc.titlePolarization-sensitive microelectromechanical systems based tunable terahertz metamaterials using three dimensional electric split-ring resonator arrays
dc.contributor.authorMa, F.
dc.contributor.authorQian, Y.
dc.contributor.authorLin, Y.-S.
dc.contributor.authorLiu, H.
dc.contributor.authorZhang, X.
dc.contributor.authorLiu, Z.
dc.contributor.authorMing-Lin Tsai, J.
dc.contributor.authorLee, C.
dc.date.accessioned2014-06-17T03:02:05Z
dc.date.available2014-06-17T03:02:05Z
dc.date.issued2013-04-22
dc.identifier.citationMa, F., Qian, Y., Lin, Y.-S., Liu, H., Zhang, X., Liu, Z., Ming-Lin Tsai, J., Lee, C. (2013-04-22). Polarization-sensitive microelectromechanical systems based tunable terahertz metamaterials using three dimensional electric split-ring resonator arrays. Applied Physics Letters 102 (16) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.4803048
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/57086
dc.description.abstractWe present the design, simulation, fabrication, and characterization of structurally reconfigurable metamaterials showing terahertz frequency tunability with a polarization-sensitivity. The proposed metamaterial structures employ deformable microelectromechanical system based curved cantilevers for tuning the resonance frequency of the electric split-ring resonators. The resonance frequency is observed to be either tunable or non-tunable with the electric field of the incident wave, which is perpendicular or parallel to the split gap of the electric split-ring resonators. This polarization-sensitive characteristic has been demonstrated by both the electromagnetic simulation and the experimental measurement. The observed polarization-sensitive tunability could be used for the development of polarization sensitive and insensitive THz polarimetric devices. © 2013 AIP Publishing LLC.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.4803048
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.4803048
dc.description.sourcetitleApplied Physics Letters
dc.description.volume102
dc.description.issue16
dc.description.page-
dc.description.codenAPPLA
dc.identifier.isiut000318269300034
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