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Title: Magnetic instability of giant magnetoresistance spin-valves due to electromigration-induced inter-diffusion
Authors: Jiang, J.
Bae, S. 
Ryu, H.
Keywords: Cu spacer inter-diffusion
Electromigration-induced failures
GMR spin-valve multi-layers
Magnetic instability
Issue Date: 31-Jul-2009
Citation: Jiang, J., Bae, S., Ryu, H. (2009-07-31). Magnetic instability of giant magnetoresistance spin-valves due to electromigration-induced inter-diffusion. Thin Solid Films 517 (18) : 5557-5562. ScholarBank@NUS Repository.
Abstract: Electromigration-induced magnetic failures in NiFe/(Co)/Cu/(Co)/NiFe spin-valve (SV) multilayers have been investigated. Electrically stressed NiFe/Cu/NiFe SV multilayers showed a dramatic reduction of magnetic moment up to 41%, and a shift of interlayer coupling characteristics, while no obvious magnetic degradation was observed in the NiFe/Co/Cu/Co/NiFe SV multilayers. It was experimentally confirmed that the magnetic degradation of the NiFe/Cu/NiFe SV multilayers is primarily due to the formation of Ni-Cu intermixing caused by the electromigration-induced Cu spacer inter-diffusion. Furthermore, it was demonstrated that an ultra thin Co diffusion barrier at the NiFe/Cu interface is promisingly effective to improve the magnetic stability of NiFe/(Co)/Cu/(Co)/NiFe SV multilayers against electromigration. © 2009 Elsevier B.V. All rights reserved.
Source Title: Thin Solid Films
ISSN: 00406090
DOI: 10.1016/j.tsf.2009.04.028
Appears in Collections:Staff Publications

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