Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/56467
DC FieldValue
dc.titleLaser-induced detection sensitivity enhancement with laser pulsing
dc.contributor.authorQuah, A.C.T.
dc.contributor.authorChua, C.M.
dc.contributor.authorTan, S.H.
dc.contributor.authorKoh, L.S.
dc.contributor.authorPhang, J.C.H.
dc.contributor.authorTan, T.L.
dc.contributor.authorGan, C.L.
dc.date.accessioned2014-06-17T02:54:55Z
dc.date.available2014-06-17T02:54:55Z
dc.date.issued2008-08
dc.identifier.citationQuah, A.C.T.,Chua, C.M.,Tan, S.H.,Koh, L.S.,Phang, J.C.H.,Tan, T.L.,Gan, C.L. (2008-08). Laser-induced detection sensitivity enhancement with laser pulsing. Electronic Device Failure Analysis 10 (3) : 18-26. ScholarBank@NUS Repository.
dc.identifier.issn15370755
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/56467
dc.description.abstractThis article describes a pulsed laser-induced digital signal integration algorithm for pulsed laser operation that is compatible with existing ac-coupled detection systems for fault localization. This algorithm enhances laser-induced detection sensitivity without a lock-in amplifier. The best detection sensitivity is achieved at a pulsing frequency range between 500 Hz and 1.5 kHz. Within this frequency range, the algorithm is capable of achieving more than nine times the enhancement in detection sensitivity. Applications of pulsed TIVA for fault localization are described. ©ASM International®.
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.sourcetitleElectronic Device Failure Analysis
dc.description.volume10
dc.description.issue3
dc.description.page18-26
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Page view(s)

88
checked on Aug 3, 2021

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.