Please use this identifier to cite or link to this item: https://doi.org/10.1109/TII.2011.2106451
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dc.titleIntegral-square-error performance of multiplexed model predictive control
dc.contributor.authorLing, K.V.
dc.contributor.authorHo, W.K.
dc.contributor.authorFeng, Y.
dc.contributor.authorWu, B.
dc.date.accessioned2014-06-17T02:53:33Z
dc.date.available2014-06-17T02:53:33Z
dc.date.issued2011-05
dc.identifier.citationLing, K.V., Ho, W.K., Feng, Y., Wu, B. (2011-05). Integral-square-error performance of multiplexed model predictive control. IEEE Transactions on Industrial Informatics 7 (2) : 196-203. ScholarBank@NUS Repository. https://doi.org/10.1109/TII.2011.2106451
dc.identifier.issn15513203
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/56346
dc.description.abstractIt is well-known that faster sampling increases computational load but gives better performance. Multiplexed Model Predictive Control (MMPC) has been proposed recently. Its motivation was to reduce real-time computational load. The reduction in computational load can be used gainfully to increase sampling rate and improve performance. Hence, in this paper, we derive a formula to compute the Integral-Square-Error (ISE) performance of a MMPC controlled system. Given the plant and disturbance models, the ISE formula derived allows one to investigate how the ISE changes with control design parameters, such as the sampling interval and control weighting. This enables one to select, for example, a suitable sampling interval for the MMPC design to achieve the desired ISE performance. In addition, we validated the ISE formula on a multizone semiconductor manufacturing thermal process. © 2011 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TII.2011.2106451
dc.sourceScopus
dc.subjectControl systems analysis
dc.subjectmultiplexing
dc.subjectperformance evaluation
dc.subjectpredictive control
dc.subjectsemiconductor process modeling
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/TII.2011.2106451
dc.description.sourcetitleIEEE Transactions on Industrial Informatics
dc.description.volume7
dc.description.issue2
dc.description.page196-203
dc.identifier.isiut000290414000006
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