Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1515120
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dc.titleHigh-resolution atomic force microscope nanotip grown by self-field emission
dc.contributor.authorOon, C.H.
dc.contributor.authorThong, J.T.L.
dc.contributor.authorLei, Y.
dc.contributor.authorChim, W.K.
dc.date.accessioned2014-06-17T02:51:58Z
dc.date.available2014-06-17T02:51:58Z
dc.date.issued2002-10-14
dc.identifier.citationOon, C.H., Thong, J.T.L., Lei, Y., Chim, W.K. (2002-10-14). High-resolution atomic force microscope nanotip grown by self-field emission. Applied Physics Letters 81 (16) : 3037-3039. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1515120
dc.identifier.issn00036951
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/56207
dc.description.abstractA technique to grow a single tungsten filament tip on a tapping mode atomic force microscope (AFM) tip by a process of self-field emission in the presence of tungsten carbonyl is demonstrated. Such filaments have a tip radius of 1-2 nm and are grown to lengths ranging from 400 nm to 3 μm and a shank diameter of about 60-90 nm. Images of germanium nanocrystals and porous alumina membranes show much higher resolution and definition than standard AFM tips. The tip shows no degradation even after 10 h of scanning, demonstrating its utility as a practical tip. The self-aligned nature of the growth makes it a very simple nanotip fabrication technique. © 2002 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1515120
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentSINGAPORE-MIT ALLIANCE
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.1515120
dc.description.sourcetitleApplied Physics Letters
dc.description.volume81
dc.description.issue16
dc.description.page3037-3039
dc.description.codenAPPLA
dc.identifier.isiut000178460500041
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