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|Title:||High-resolution atomic force microscope nanotip grown by self-field emission||Authors:||Oon, C.H.
|Issue Date:||14-Oct-2002||Citation:||Oon, C.H., Thong, J.T.L., Lei, Y., Chim, W.K. (2002-10-14). High-resolution atomic force microscope nanotip grown by self-field emission. Applied Physics Letters 81 (16) : 3037-3039. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1515120||Abstract:||A technique to grow a single tungsten filament tip on a tapping mode atomic force microscope (AFM) tip by a process of self-field emission in the presence of tungsten carbonyl is demonstrated. Such filaments have a tip radius of 1-2 nm and are grown to lengths ranging from 400 nm to 3 μm and a shank diameter of about 60-90 nm. Images of germanium nanocrystals and porous alumina membranes show much higher resolution and definition than standard AFM tips. The tip shows no degradation even after 10 h of scanning, demonstrating its utility as a practical tip. The self-aligned nature of the growth makes it a very simple nanotip fabrication technique. © 2002 American Institute of Physics.||Source Title:||Applied Physics Letters||URI:||http://scholarbank.nus.edu.sg/handle/10635/56207||ISSN:||00036951||DOI:||10.1063/1.1515120|
|Appears in Collections:||Staff Publications|
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