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https://doi.org/10.1063/1.1515120
Title: | High-resolution atomic force microscope nanotip grown by self-field emission | Authors: | Oon, C.H. Thong, J.T.L. Lei, Y. Chim, W.K. |
Issue Date: | 14-Oct-2002 | Citation: | Oon, C.H., Thong, J.T.L., Lei, Y., Chim, W.K. (2002-10-14). High-resolution atomic force microscope nanotip grown by self-field emission. Applied Physics Letters 81 (16) : 3037-3039. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1515120 | Abstract: | A technique to grow a single tungsten filament tip on a tapping mode atomic force microscope (AFM) tip by a process of self-field emission in the presence of tungsten carbonyl is demonstrated. Such filaments have a tip radius of 1-2 nm and are grown to lengths ranging from 400 nm to 3 μm and a shank diameter of about 60-90 nm. Images of germanium nanocrystals and porous alumina membranes show much higher resolution and definition than standard AFM tips. The tip shows no degradation even after 10 h of scanning, demonstrating its utility as a practical tip. The self-aligned nature of the growth makes it a very simple nanotip fabrication technique. © 2002 American Institute of Physics. | Source Title: | Applied Physics Letters | URI: | http://scholarbank.nus.edu.sg/handle/10635/56207 | ISSN: | 00036951 | DOI: | 10.1063/1.1515120 |
Appears in Collections: | Staff Publications |
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