Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1791321
DC FieldValue
dc.titleFabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique
dc.contributor.authorTay, A.B.H.
dc.contributor.authorThong, J.T.L.
dc.date.accessioned2014-06-17T02:49:29Z
dc.date.available2014-06-17T02:49:29Z
dc.date.issued2004-10
dc.identifier.citationTay, A.B.H., Thong, J.T.L. (2004-10). Fabrication of super-sharp nanowire atomic force microscope probes using a field emission induced growth technique. Review of Scientific Instruments 75 (10 I) : 3248-3255. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1791321
dc.identifier.issn00346748
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/55993
dc.description.abstractA relatively simple and consistent technique based on field emission induced growth has been developed to grow a single metallic nanowire on an atomic force microscope (AFM) tip. A clamping setup with two micromanipulators ensures that the fabrication of a vertically aligned nanowire probe, which is sharp, robust, and with high aspect ratio, can be achieved on different types of AFM cantilevers with different force constants. The controlled growth technique has been used to produce tungsten nanowire AFM probes with great consistency and high reproducibility. The tungsten nanowires were grown to lengths between 100 nm to 1.5 μm with radius of curvature at the tip end typically between l-2 nm. Experiments using the fabricated tungsten nanowire AFM probe demonstrate its ability to produce high-resolution AFM images and improved profiling of structures with steep sidewalls due to its very sharp tip and high aspect ratio. The technique can be extended to fabricating other types of metallic nanowire AFM probes or even composite nanowire AFM probes by using different precursor gases. Experiments have been successful in fabricating cobalt nanowire AFM probes which are able to produce good high-resolution AFM images as well. © 2004 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.1791321
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.1791321
dc.description.sourcetitleReview of Scientific Instruments
dc.description.volume75
dc.description.issue10 I
dc.description.page3248-3255
dc.description.codenRSINA
dc.identifier.isiut000224755800024
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

28
checked on Jun 25, 2019

WEB OF SCIENCETM
Citations

25
checked on Jun 25, 2019

Page view(s)

40
checked on May 25, 2019

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.