Please use this identifier to cite or link to this item:
https://doi.org/10.1109/TMAG.2012.2212024
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dc.title | Electromigration in giant magnetoresistance spin valve read sensors under pulsed dc magnetic field: An analytical and numerical study | |
dc.contributor.author | Zeng, D.G. | |
dc.contributor.author | Lee, K.-I. | |
dc.contributor.author | Chung, K.-W. | |
dc.contributor.author | Bae, S. | |
dc.date.accessioned | 2014-06-17T02:47:49Z | |
dc.date.available | 2014-06-17T02:47:49Z | |
dc.date.issued | 2013 | |
dc.identifier.citation | Zeng, D.G., Lee, K.-I., Chung, K.-W., Bae, S. (2013). Electromigration in giant magnetoresistance spin valve read sensors under pulsed dc magnetic field: An analytical and numerical study. IEEE Transactions on Magnetics 49 (2) : 845-850. ScholarBank@NUS Repository. https://doi.org/10.1109/TMAG.2012.2212024 | |
dc.identifier.issn | 00189464 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/55849 | |
dc.description.abstract | A theoretical model is proposed to investigate the electromigration (EM) behavior in giant magnetoresistance spin valve (GMR SV) read sensors under pulsed direct current (dc) magnetic field during sensor operation. It was found that the externally applied magnetic field gives rise to a more severe Joule heating and consequently raises the device temperature leading to EM acceleration. Black's equation was modified based on Green's function method and the Boltzmann equation to more precisely interpret the EM mean time to failure (MTTF) of GMR SV read sensors under pulsed dc magnetic field. The physical validity of this proposed model was confirmed by the comparisons with experimental results. © 1965-2012 IEEE. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TMAG.2012.2212024 | |
dc.source | Scopus | |
dc.subject | Black's equation | |
dc.subject | electromigration (EM) | |
dc.subject | giant magnetoresistance spin valve (GMR SV) read sensor | |
dc.subject | pulsed direct current (dc) magnetic field | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1109/TMAG.2012.2212024 | |
dc.description.sourcetitle | IEEE Transactions on Magnetics | |
dc.description.volume | 49 | |
dc.description.issue | 2 | |
dc.description.page | 845-850 | |
dc.description.coden | IEMGA | |
dc.identifier.isiut | 000314162600012 | |
Appears in Collections: | Staff Publications |
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