Please use this identifier to cite or link to this item: https://doi.org/10.1109/TMAG.2012.2212024
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dc.titleElectromigration in giant magnetoresistance spin valve read sensors under pulsed dc magnetic field: An analytical and numerical study
dc.contributor.authorZeng, D.G.
dc.contributor.authorLee, K.-I.
dc.contributor.authorChung, K.-W.
dc.contributor.authorBae, S.
dc.date.accessioned2014-06-17T02:47:49Z
dc.date.available2014-06-17T02:47:49Z
dc.date.issued2013
dc.identifier.citationZeng, D.G., Lee, K.-I., Chung, K.-W., Bae, S. (2013). Electromigration in giant magnetoresistance spin valve read sensors under pulsed dc magnetic field: An analytical and numerical study. IEEE Transactions on Magnetics 49 (2) : 845-850. ScholarBank@NUS Repository. https://doi.org/10.1109/TMAG.2012.2212024
dc.identifier.issn00189464
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/55849
dc.description.abstractA theoretical model is proposed to investigate the electromigration (EM) behavior in giant magnetoresistance spin valve (GMR SV) read sensors under pulsed direct current (dc) magnetic field during sensor operation. It was found that the externally applied magnetic field gives rise to a more severe Joule heating and consequently raises the device temperature leading to EM acceleration. Black's equation was modified based on Green's function method and the Boltzmann equation to more precisely interpret the EM mean time to failure (MTTF) of GMR SV read sensors under pulsed dc magnetic field. The physical validity of this proposed model was confirmed by the comparisons with experimental results. © 1965-2012 IEEE.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/TMAG.2012.2212024
dc.sourceScopus
dc.subjectBlack's equation
dc.subjectelectromigration (EM)
dc.subjectgiant magnetoresistance spin valve (GMR SV) read sensor
dc.subjectpulsed direct current (dc) magnetic field
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/TMAG.2012.2212024
dc.description.sourcetitleIEEE Transactions on Magnetics
dc.description.volume49
dc.description.issue2
dc.description.page845-850
dc.description.codenIEMGA
dc.identifier.isiut000314162600012
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