Please use this identifier to cite or link to this item:
|Title:||Electric field-enhanced degradation of porous methylsilsesquioxane polymer as observed by in situ FTIRS||Authors:||Yiang, K.Y.
|Issue Date:||2004||Citation:||Yiang, K.Y., Yoo, W.J., Krishnamoorthy, A. (2004). Electric field-enhanced degradation of porous methylsilsesquioxane polymer as observed by in situ FTIRS. Electrochemical and Solid-State Letters 7 (12) : F99-F102. ScholarBank@NUS Repository. https://doi.org/10.1149/1.1819891||Abstract:||Although the thermochemical model attributes field-induced dielectric breakdown to time-dependent chemical bond breakage, there has been little evidence of this reported thus far. This study provides, for the first time, evidence of field-induced chemical bond disturbance using in situ Fourier transform infrared spectroscopy (FTIRS). By using porous methylsilsesquioxane as test vehicle and subjecting the film to externally applied electric field, changes in peak area ratio and intensities in the deconvoluted spectra were observed. The precursors of dielectric degradation are the Si - O and Si - OH bonds. This is a powerful technique which provides new insights into the dielectric degradation and breakdown phenomena. © 2004 The Electrochemical Society.||Source Title:||Electrochemical and Solid-State Letters||URI:||http://scholarbank.nus.edu.sg/handle/10635/55811||ISSN:||10990062||DOI:||10.1149/1.1819891|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jan 19, 2021
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.