Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.jcrysgro.2006.11.281
DC FieldValue
dc.titleAnneal-induced structural changes of GaIn(N)As/Ga(N)As multiple quantum wells grown by molecular beam epitaxy
dc.contributor.authorLiu, H.F.
dc.contributor.authorXiang, N.
dc.contributor.authorZhou, H.L.
dc.contributor.authorChua, S.J.
dc.contributor.authorYang, P.
dc.contributor.authorMoser, H.O.
dc.date.accessioned2014-06-17T02:39:23Z
dc.date.available2014-06-17T02:39:23Z
dc.date.issued2007-04
dc.identifier.citationLiu, H.F., Xiang, N., Zhou, H.L., Chua, S.J., Yang, P., Moser, H.O. (2007-04). Anneal-induced structural changes of GaIn(N)As/Ga(N)As multiple quantum wells grown by molecular beam epitaxy. Journal of Crystal Growth 301-302 (SPEC. ISS.) : 548-551. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jcrysgro.2006.11.281
dc.identifier.issn00220248
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/55118
dc.description.abstractTwo types of multiple quantum wells (MQWs) have been grown by means of molecular beam epitaxy; one is GaInAs/GaAs and the other is GaInNAs/GaNAs. Deteriorated structural qualities were observed in the GaInNAs/GaNAs MQWs with a low N concentration as compared to the N-free MQWs grown at the same conditions; an increase of N content within the QWs avoids the structure deterioration. The evolution of X-ray diffraction patterns, due to post-growth thermal annealing indicates that In/Ga interdiffusions occurred in both types of MQWs at elevated temperatures. The diffusion length deduced from the dynamic simulations shows a decrease with the increase of N concentration. The interfaces roughness plays a minor role in the interdiffusion. The thermal stabilities of GaInNAs/GaNAs MQW structures are improved by the incorporation of N. © 2007 Elsevier B.V. All rights reserved.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.jcrysgro.2006.11.281
dc.sourceScopus
dc.subjectA1. High-resolution X-ray diffraction
dc.subjectA1. Rapid thermal annealing
dc.subjectA3. Molecular beam epitaxy
dc.subjectB2. Semiconducting III-V materials
dc.typeArticle
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.contributor.departmentSINGAPORE SYNCHROTRON LIGHT SOURCE
dc.description.doi10.1016/j.jcrysgro.2006.11.281
dc.description.sourcetitleJournal of Crystal Growth
dc.description.volume301-302
dc.description.issueSPEC. ISS.
dc.description.page548-551
dc.description.codenJCRGA
dc.identifier.isiut000246015800126
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