Please use this identifier to cite or link to this item:
https://doi.org/10.1016/j.jcrysgro.2006.11.281
DC Field | Value | |
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dc.title | Anneal-induced structural changes of GaIn(N)As/Ga(N)As multiple quantum wells grown by molecular beam epitaxy | |
dc.contributor.author | Liu, H.F. | |
dc.contributor.author | Xiang, N. | |
dc.contributor.author | Zhou, H.L. | |
dc.contributor.author | Chua, S.J. | |
dc.contributor.author | Yang, P. | |
dc.contributor.author | Moser, H.O. | |
dc.date.accessioned | 2014-06-17T02:39:23Z | |
dc.date.available | 2014-06-17T02:39:23Z | |
dc.date.issued | 2007-04 | |
dc.identifier.citation | Liu, H.F., Xiang, N., Zhou, H.L., Chua, S.J., Yang, P., Moser, H.O. (2007-04). Anneal-induced structural changes of GaIn(N)As/Ga(N)As multiple quantum wells grown by molecular beam epitaxy. Journal of Crystal Growth 301-302 (SPEC. ISS.) : 548-551. ScholarBank@NUS Repository. https://doi.org/10.1016/j.jcrysgro.2006.11.281 | |
dc.identifier.issn | 00220248 | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/55118 | |
dc.description.abstract | Two types of multiple quantum wells (MQWs) have been grown by means of molecular beam epitaxy; one is GaInAs/GaAs and the other is GaInNAs/GaNAs. Deteriorated structural qualities were observed in the GaInNAs/GaNAs MQWs with a low N concentration as compared to the N-free MQWs grown at the same conditions; an increase of N content within the QWs avoids the structure deterioration. The evolution of X-ray diffraction patterns, due to post-growth thermal annealing indicates that In/Ga interdiffusions occurred in both types of MQWs at elevated temperatures. The diffusion length deduced from the dynamic simulations shows a decrease with the increase of N concentration. The interfaces roughness plays a minor role in the interdiffusion. The thermal stabilities of GaInNAs/GaNAs MQW structures are improved by the incorporation of N. © 2007 Elsevier B.V. All rights reserved. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1016/j.jcrysgro.2006.11.281 | |
dc.source | Scopus | |
dc.subject | A1. High-resolution X-ray diffraction | |
dc.subject | A1. Rapid thermal annealing | |
dc.subject | A3. Molecular beam epitaxy | |
dc.subject | B2. Semiconducting III-V materials | |
dc.type | Article | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.contributor.department | SINGAPORE SYNCHROTRON LIGHT SOURCE | |
dc.description.doi | 10.1016/j.jcrysgro.2006.11.281 | |
dc.description.sourcetitle | Journal of Crystal Growth | |
dc.description.volume | 301-302 | |
dc.description.issue | SPEC. ISS. | |
dc.description.page | 548-551 | |
dc.description.coden | JCRGA | |
dc.identifier.isiut | 000246015800126 | |
Appears in Collections: | Staff Publications |
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