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Please use this identifier to cite or link to this item: https://doi.org/10.1109/LMWC.2004.827840
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dc.titleA scaling technique for partial element equivalent circuit analysis using SPICE
dc.contributor.authorJayabalan, J.
dc.contributor.authorLeong, O.B.
dc.contributor.authorSeng, L.M.
dc.contributor.authorIyer, M.K.
dc.date.accessioned2014-06-17T02:35:39Z
dc.date.available2014-06-17T02:35:39Z
dc.date.issued2004-05
dc.identifier.citationJayabalan, J., Leong, O.B., Seng, L.M., Iyer, M.K. (2004-05). A scaling technique for partial element equivalent circuit analysis using SPICE. IEEE Microwave and Wireless Components Letters 14 (5) : 216-218. ScholarBank@NUS Repository. https://doi.org/10.1109/LMWC.2004.827840
dc.identifier.issn15311309
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/54799
dc.description.abstractA scaling technique for partial element equivalent circuit (PEEC) analysis using SPICE is introduced in this letter. The perturbation series based scaling is applied to the component values extracted by the standard PEEC method to get upto an order of magnitude improvement in relative accuracy of scattering parameters with SPICE simulation. The effectiveness of the technique is verified by using the numerical example of a stripline structure and comparing the results with that of the Method of Moments (IE3D).
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/LMWC.2004.827840
dc.sourceScopus
dc.subjectBaker-Campbell-Hausdorff-Dynkin series
dc.subjectParasitic extraction
dc.subjectPartial element equivalent circuit
dc.subjectScaling algorithm
dc.subjectSPICE
dc.typeArticle
dc.contributor.departmentMECHANICAL ENGINEERING
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/LMWC.2004.827840
dc.description.sourcetitleIEEE Microwave and Wireless Components Letters
dc.description.volume14
dc.description.issue5
dc.description.page216-218
dc.description.codenIMWCB
dc.identifier.isiut000221313500010
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