Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/53154
DC FieldValue
dc.titleSecondary and backscattered electron yields of polymer surface under electron beam irradiation
dc.contributor.authorSong, Z.G.
dc.contributor.authorOng, C.K.
dc.contributor.authorGong, H.
dc.date.accessioned2014-05-19T02:54:55Z
dc.date.available2014-05-19T02:54:55Z
dc.date.issued1997-09
dc.identifier.citationSong, Z.G.,Ong, C.K.,Gong, H. (1997-09). Secondary and backscattered electron yields of polymer surface under electron beam irradiation. Applied Surface Science 119 (1-2) : 169-175. ScholarBank@NUS Repository.
dc.identifier.issn01694332
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/53154
dc.description.abstractThe radiation behavior of a polymer surface has been investigated employing a scanning electron microscope (SEM). The charging, breakdown or flashover, and electron-blow-off phenomena caused by continuous irradiation have been observed. By positively biasing the polymer surface, the backscattered electrons can be separated from the total electron emission. This method has been applied for the determination of the secondary and backscattered electron yields of polymethylmethacrylate (PMMA), low density polyethylene (LDPE) and polytetrafluoroethylene (PTFE) surfaces. The experimental results reveal that the secondary and backscattered electron yields are dependent on the incident electron beam energy by a power law when the energy is in the range of 5 keV to 35 keV. © 1997 Elsevier Science B.V.
dc.sourceScopus
dc.subjectBackscattered electron yield
dc.subjectElectron beam
dc.subjectIrradiation
dc.subjectPolymer
dc.subjectSecondary electron yield
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.contributor.departmentMATERIALS SCIENCE
dc.description.sourcetitleApplied Surface Science
dc.description.volume119
dc.description.issue1-2
dc.description.page169-175
dc.description.codenASUSE
dc.identifier.isiutNOT_IN_WOS
Appears in Collections:Staff Publications

Show simple item record
Files in This Item:
There are no files associated with this item.

Page view(s)

81
checked on Dec 1, 2020

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.