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Title: 6H-SiC(0 0 0 1) phase transition: Evolution of the (6 × 6) magic clusters
Authors: Tok, E.S. 
Ong, W.J.
Wee, A.T.S. 
Keywords: Clusters
Scanning tunneling microscopy
Silicon carbide
Surface structure, morphology, roughness, and topography
Surface thermodynamics (including phase transitions)
Issue Date: 1-Jun-2004
Citation: Tok, E.S., Ong, W.J., Wee, A.T.S. (2004-06-01). 6H-SiC(0 0 0 1) phase transition: Evolution of the (6 × 6) magic clusters. Surface Science 558 (1-3) : 145-158. ScholarBank@NUS Repository.
Abstract: Scanning tunneling microscopy (STM) is used to probe the local atomic structure of the 6H-SiC(0 0 0 1) surface together with X-ray photoelectron spectroscopy (XPS) in UHV. We report STM observation of localized clusters assembled in an ordered (6×6) arrangement after annealing the (3×3) phase at 1000 °C. These clusters are round in shape and possess a diameter of 14.3 ± 0.5 Å and a height of 2.3 ± 0.2 Å. Further annealing of the surface beyond 1000 °C caused the clusters to disappear and we observed the formation of a (6×6) ring-like structure at 1050 °C. XPS data show that the surface is still Si rich, unlike the (6√3×6√3) phase or graphitic honeycomb structures which normally formed above this temperature. Observation of defect and cluster formation, as well as tetramer agglomeration, suggests the rearrangement of the (3×3) structure as temperature increases. STM is used to study this mechanism leading to the formation of (6×6) clusters. We propose a model utilizing Si tetra-cluster units as building blocks to elucidate the structure of the (6×6) clusters and explain the structural transformation observed. © 2004 Elsevier B.V. All rights reserved.
Source Title: Surface Science
ISSN: 00396028
DOI: 10.1016/j.susc.2004.03.062
Appears in Collections:Staff Publications

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