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|Title:||Planning step-stress life-test with a target acceleration-factor||Authors:||Yeo, K.-P.
|Issue Date:||1999||Citation:||Yeo, K.-P., Tang, L.-C. (1999). Planning step-stress life-test with a target acceleration-factor. IEEE Transactions on Reliability 48 (1) : 61-67. ScholarBank@NUS Repository. https://doi.org/10.1109/24.765928||Abstract:||A sequential approach is presented to plan a multiple-steps step-stress accelerated life test (SSALT) with type-I censoring so as to achieve a pre-specified acceleration factor. An initial optimal plan for a simple SSALT, where one not only has to determine the optimum hold-time under low stress but also the optimum low stress level, is obtained by solving a constrained non-linear program. A backward recursion scheme generates the subsequent optimal low-stress levels and hold-times for multiple-step SSALT. An illustration using a 3-step SSALT is presented. The relative efficiency of the 2-step and 3-step SSALT is investigated. A numerical example illustrates the method under 2-step and 3-step SSALT.||Source Title:||IEEE Transactions on Reliability||URI:||http://scholarbank.nus.edu.sg/handle/10635/51864||ISSN:||00189529||DOI:||10.1109/24.765928|
|Appears in Collections:||Staff Publications|
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