Please use this identifier to cite or link to this item: https://doi.org/10.1117/12.429546
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dc.titleUse of optical technique for inspection of warpage of IC packages
dc.contributor.authorToh, S.L.
dc.contributor.authorChau, F.S.
dc.contributor.authorOng, S.H.
dc.date.accessioned2014-04-24T08:38:20Z
dc.date.available2014-04-24T08:38:20Z
dc.date.issued2001
dc.identifier.citationToh, S.L., Chau, F.S., Ong, S.H. (2001). Use of optical technique for inspection of warpage of IC packages. Proceedings of SPIE - The International Society for Optical Engineering 4317 : 610-615. ScholarBank@NUS Repository. https://doi.org/10.1117/12.429546
dc.identifier.issn0277786X
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/51272
dc.description.abstractThe packaging of IC packages has changed over the years, from dual-inline, wire-bond, and pin-through-hole in printed wiring board technologies in the 1970s to bali grid array, chip scale and surface mount technologies in the 1990s. Reliability has been a big problem for manufacturers for some moisture-sensitive packages. One of the potential problems in plastic IC packages is moisture-induced popcorn effect which can arise during the reflow process. Shearography is a non-destructive inspection technique that may be used to detect the delamination and warpage of IC packages. It is non-contacting and permits a full-field observation of surface displacement derivatives. Another advantage of this technique is that it is able to give the real-time formation of the fringes which indicate flaws in the IC package under real-time simulation condition of Surface Mount Technology (SMT) IR reflow profile. It is extremely fast and convenient to study the true behaviour of the packaging deformation during the SMT pro cess. It can be concluded that shearography has the potential for the real-time detection, in situ and non-destructive inspection of IC packages during the surface mount process.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1117/12.429546
dc.sourceScopus
dc.subjectDigital speckle shearing interferometery
dc.subjectElectronic packages
dc.subjectNon-destructive testing
dc.subjectOptical technique
dc.typeConference Paper
dc.contributor.departmentMECHANICAL ENGINEERING
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1117/12.429546
dc.description.sourcetitleProceedings of SPIE - The International Society for Optical Engineering
dc.description.volume4317
dc.description.page610-615
dc.description.codenPSISD
dc.identifier.isiut000171040900100
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