Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3559481
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dc.titleLow switching current in a modified exchange-biased spin valve via antiferromagnetic spin transfer torque
dc.contributor.authorGuo, J.
dc.contributor.authorJalil, M.B.A.
dc.contributor.authorGhee, S.
dc.date.accessioned2014-04-24T08:36:19Z
dc.date.available2014-04-24T08:36:19Z
dc.date.issued2011-04-01
dc.identifier.citationGuo, J., Jalil, M.B.A., Ghee, S. (2011-04-01). Low switching current in a modified exchange-biased spin valve via antiferromagnetic spin transfer torque. Journal of Applied Physics 109 (7) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3559481
dc.identifier.issn00218979
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/51204
dc.description.abstractWe analyze the current-induced spin transfer torque and magnetization reversal properties in an exchanged-biased spin valve (EBSV) structure FM2/NM/FM1/AFM, taking into consideration the exchange interaction between the ferromagnetic (FM) and the antiferromagnetic (AFM) layers. The passage of the spin current above a certain threshold value causes the magnetization to switch in some parts of the AFM layer. This in turn leads to a change in the magnitude and direction of the exchange-bias field, which can subsequently assist or hinder the magnetization switching of the adjacent FM layer and results in so-called inverse current-induced magnetization switching for a weakly-biased EBSV structure. The requisite critical current density to switch the AFM layer is theoretically found to be lower than that for the FM layer, which provides us a potential method to substantially reduce the critical current density for the spin transfer switching in EBSV-based devices. © 2011 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3559481
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentNUS NANOSCIENCE & NANOTECH INITIATIVE
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1063/1.3559481
dc.description.sourcetitleJournal of Applied Physics
dc.description.volume109
dc.description.issue7
dc.description.page-
dc.description.codenJAPIA
dc.identifier.isiut000289952100160
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