Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/50628
Title: Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors
Authors: Yeo, S.P. 
Ang, C.K.
Cheng, M. 
Issue Date: 1998
Citation: Yeo, S.P.,Ang, C.K.,Cheng, M. (1998). Improved technique for measuring complex scattering coefficients of two-port microwave devices using only six power detectors. Conference Record - IEEE Instrumentation and Measurement Technology Conference 1 : 638-641. ScholarBank@NUS Repository.
Abstract: The paper describes an improved technique for measuring the complex scattering coefficients of microwave two-port devices using the novel nine-port network analyzer. Tests on earlier prototypes of this instrument (comprising two symmetrical five-port junctions, six power detectors, two directional couplers and a phase shifter) have demonstrated that a re-arrangement of the inter-connections among the constituent components is able to yield an enhancement of performance (due to changes in the interaction of the waves within the system).
Source Title: Conference Record - IEEE Instrumentation and Measurement Technology Conference
URI: http://scholarbank.nus.edu.sg/handle/10635/50628
Appears in Collections:Staff Publications

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