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Title: A reliability modeling framework for the hard disk drive development process
Authors: Tang, L.C. 
Lam, S.W. 
Ng, Q.Y.
Goh, J.S.
Keywords: Accelerated testing
Generalized non-linear models
Hard disk drives
Monotone LOWESS
Reliability improvement
Issue Date: 2010
Citation: Tang, L.C., Lam, S.W., Ng, Q.Y., Goh, J.S. (2010). A reliability modeling framework for the hard disk drive development process. IIE Transactions (Institute of Industrial Engineers) 42 (4) : 260-272. ScholarBank@NUS Repository.
Abstract: Motivated by the fact that the major causes of catastrophic failure in micro hard disk drives are mostly induced by the presence of particles, a new particle-induced failure susceptibility metric, called the Cumulative Particle Counts (CPC), is proposed for managing reliability risk in a fast-paced hard disk drive product development process. This work is thought to represent the first successful attempt to predict particle-induced failure through an accelerated testing framework which leverages on existing streams of research for both particle-injection-based and inherent-particle-generation laboratory experiments to produce a practical reliability prediction framework. In particular, a new testing technique that injects particles into hard disk drives so as to increase the susceptibility of failure is introduced. The experimental results are then analyzed through a proposed framework which comprises the modeling of a CPC-to-failure distribution. The framework also requires the estimation of the growth curve for the CPC in a prime hard disk drive under normal operating conditions without particle injection. Both parametric and non-parametric inferences are presented for the estimation of the CPC growth curve. Statistical inferential procedures are developed in relation to a proposed non-linear CPC growth curve with a change-point. Finally, two applications of the framework to design selection during an actual hard disk drive development project and the subsequent assessment of reliability growth are discussed. © 2010 "IIE".
Source Title: IIE Transactions (Institute of Industrial Engineers)
ISSN: 0740817X
DOI: 10.1080/07408170902906019
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