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Title: Dual analysis for proving safety and finding bugs
Authors: Popeea, C.
Chin, W.-N. 
Keywords: numerical domains
static analysis
Issue Date: 2010
Citation: Popeea, C.,Chin, W.-N. (2010). Dual analysis for proving safety and finding bugs. Proceedings of the ACM Symposium on Applied Computing : 2137-2143. ScholarBank@NUS Repository.
Abstract: Program bugs remain a major challenge for software developers and various tools have been proposed to help with their localization and elimination. Most present-day tools are based either on over-approximating techniques that can prove safety but may report false positives, or on under-approximating techniques that can find real bugs but with possible false negatives. In this paper, we propose a dual static analysis that is based on only over-approximation. Its main novelty is to concurrently derive conditions that lead to either success or failure outcomes and thus we provide a comprehensive solution for both proving safety and finding real program bugs. We have proven the soundness of our approach and have implemented a prototype system that is validated by a set of experiments. © 2010 ACM.
Source Title: Proceedings of the ACM Symposium on Applied Computing
ISBN: 9781605586380
DOI: 10.1145/1774088.1774538
Appears in Collections:Staff Publications

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