Please use this identifier to cite or link to this item:
https://doi.org/10.1038/s41598-021-87188-w
DC Field | Value | |
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dc.title | Author Correction: Quantitative material analysis using secondary electron energy spectromicroscopy (Scientific Reports, (2020), 10, 1, (22144), 10.1038/s41598-020-78973-0) | |
dc.contributor.author | Han, W. | |
dc.contributor.author | Zheng, M. | |
dc.contributor.author | Banerjee, A. | |
dc.contributor.author | Luo, Y. Z. | |
dc.contributor.author | Shen, L. | |
dc.contributor.author | Khursheed, A. | |
dc.date.accessioned | 2022-10-11T07:49:06Z | |
dc.date.available | 2022-10-11T07:49:06Z | |
dc.date.issued | 2021-04-01 | |
dc.identifier.citation | Han, W., Zheng, M., Banerjee, A., Luo, Y. Z., Shen, L., Khursheed, A. (2021-04-01). Author Correction: Quantitative material analysis using secondary electron energy spectromicroscopy (Scientific Reports, (2020), 10, 1, (22144), 10.1038/s41598-020-78973-0). Scientific Reports 11 (1) : 7626. ScholarBank@NUS Repository. https://doi.org/10.1038/s41598-021-87188-w | |
dc.identifier.issn | 2045-2322 | |
dc.identifier.uri | https://scholarbank.nus.edu.sg/handle/10635/231956 | |
dc.description.abstract | This Article contains an error in Figure 5, where Figure 5d is a duplication of Figure 5b. The correct Figure 5 appears below as Figure 1. © 2021, The Author(s). | |
dc.publisher | Nature Research | |
dc.rights | Attribution 4.0 International | |
dc.rights.uri | https://creativecommons.org/licenses/by/4.0/ | |
dc.source | Scopus OA2021 | |
dc.type | Erratum | |
dc.contributor.department | DEPT OF ELECTRICAL & COMPUTER ENGG | |
dc.contributor.department | DEPT OF MECHANICAL ENGINEERING | |
dc.contributor.department | MECHANICAL ENGINEERING | |
dc.description.doi | 10.1038/s41598-021-87188-w | |
dc.description.sourcetitle | Scientific Reports | |
dc.description.volume | 11 | |
dc.description.issue | 1 | |
dc.description.page | 7626 | |
Appears in Collections: | Elements Staff Publications |
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