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Please use this identifier to cite or link to this item: https://doi.org/10.1093/jmicro/dfv369
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dc.titleAutomated data collection in single particle electron microscopy
dc.contributor.authorTan, Yong Zi
dc.contributor.authorCheng, Anchi
dc.contributor.authorPotter, Clinton S
dc.contributor.authorCarragher, Bridget
dc.date.accessioned2022-06-21T02:28:21Z
dc.date.available2022-06-21T02:28:21Z
dc.date.issued2016-02-01
dc.identifier.citationTan, Yong Zi, Cheng, Anchi, Potter, Clinton S, Carragher, Bridget (2016-02-01). Automated data collection in single particle electron microscopy. MICROSCOPY 65 (1) : 43-56. ScholarBank@NUS Repository. https://doi.org/10.1093/jmicro/dfv369
dc.identifier.issn20505698
dc.identifier.issn20505701
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/227221
dc.description.abstractAutomated data collection is an integral part of modern workflows in single particle electron microscopy (EM) research. This review surveys the software packages available for automated single particle EM data collection. The degree of automation at each stage of data collection is evaluated, and the capabilities of the software packages are described. Finally, future trends in automation are discussed.
dc.language.isoen
dc.publisherOXFORD UNIV PRESS
dc.sourceElements
dc.subjectScience & Technology
dc.subjectTechnology
dc.subjectMicroscopy
dc.subjectsingle particle electron microscopy
dc.subjectdata collection
dc.subjectautomation
dc.subjecttarget acquisition
dc.subjectsoftware packages
dc.subjecthigh throughput
dc.subjectCOMA-FREE ALIGNMENT
dc.subjectCRYO-EM
dc.subjectCRYOELECTRON MICROSCOPY
dc.subjectDATA-ACQUISITION
dc.subjectCCD CAMERAS
dc.subjectANGSTROM RESOLUTION
dc.subject3-FOLD ASTIGMATISM
dc.subjectSTRUCTURAL BIOLOGY
dc.subject2D CRYSTALLIZATION
dc.subjectSOFTWARE PLATFORM
dc.typeReview
dc.date.updated2022-06-18T15:05:16Z
dc.contributor.departmentBIOLOGICAL SCIENCES
dc.description.doi10.1093/jmicro/dfv369
dc.description.sourcetitleMICROSCOPY
dc.description.volume65
dc.description.issue1
dc.description.page43-56
dc.published.statePublished
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