Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/224557
Title: TRANSPORT MEASUREMENT AND SCANNING IMAGING ON TWO DIMENSIONAL MATERIALS
Authors: ZHAO JINPEI
Keywords: 2D materials,twistronics,superconductivity,transport,single electron transistor,compressibility
Issue Date: 21-Aug-2021
Citation: ZHAO JINPEI (2021-08-21). TRANSPORT MEASUREMENT AND SCANNING IMAGING ON TWO DIMENSIONAL MATERIALS. ScholarBank@NUS Repository.
Abstract: π‘π‘π‘†π‘’2 is a type II superconductor with its superconductivity preserved from bulk all the way down to one atomic layer. We used both electrochemical and mechanical exfoliation to fabricate twisted atomic-layer 𝑁𝑏𝑆𝑒2 devices with high quality. In those devices, we observed exotic features which are not expected in pristine isotropic superconductors. The critical current of such twisted 𝑁𝑏𝑆𝑒2 showed oscillatory behavior under out-of-plane magnetic field, which we attributed to the formation of Josephson junction array aided by moirΓ© superlattice. To uncover the microscopic picture of vortex configuration in twisted 𝑁𝑏𝑆𝑒2, we developed a new scanning probe measurement technique based on the single electron transistor. We have achieved ~100 π‘›π‘š spatial resolution and ~30 πœ‡π‘‰ voltage sensitivity in our setup. We demonstrated the operability and validity of this scanning SET probe by approaching 2D π‘€π‘œπ‘†2 and measuring its surface potential and electronic compressibility.
URI: https://scholarbank.nus.edu.sg/handle/10635/224557
Appears in Collections:Ph.D Theses (Open)

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