Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/214485
Title: CHARACTERIZATION OF ELECTRICALLY EXCITED SURFACE PLASMON POLARITONS USING BACK FOCAL PLANE MICROSCOPY
Authors: RADULESCU ANDREEA
ORCID iD:   orcid.org/0000-0002-2492-7156
Keywords: plasmonics, metal-insulator-metal tunnel junctions, inelastic tunneling, electrical excitation of plasmons, back focal plane imaging
Issue Date: 6-Jul-2021
Citation: RADULESCU ANDREEA (2021-07-06). CHARACTERIZATION OF ELECTRICALLY EXCITED SURFACE PLASMON POLARITONS USING BACK FOCAL PLANE MICROSCOPY. ScholarBank@NUS Repository.
Abstract: Metal-insulator-metal tunnel junctions (MIM-TJs) have emerged as possible sources for on-chip electrically excited surface plasmon polaritons (SPPs), with applications in sensing, opto-electronics, signal waveguiding, quantum information processing. In MIM-TJs a highly-confined cavity mode (MIM-SPP) is excited, which further outcouples to photons and SPPs via multiple pathways. Even though recent works have tried to elucidate the MIM-SPP decay pathways, there is still a lack of control over the outcoupling process. This thesis investigates the outcoupling mechanisms of electrically excited SPPs via back focal plane imaging and shows that by changing the geometry of the MIM-TJ, we control the electron tunneling direction which, in turn, allows the control over the MIM-SPP outcoupling pathways. We further show that the outcoupling of the MIM-SPP to SPPs/photons preserves its coherence, and that by changing the geometry of the plasmonic waveguide we can control the edge diffraction of the SPPs propagating away from the MIM-TJ.
URI: https://scholarbank.nus.edu.sg/handle/10635/214485
Appears in Collections:Ph.D Theses (Open)

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