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Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/207619
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dc.titleDEVELOPMENT OF ADVANCED MULTI-FREQUENCY SCANNING PROBE MICROSCOPIES FOR NANOSCALE PHYSICAL PROPERTIES CHARACTERIZATION
dc.contributor.authorZENG QIBIN
dc.date.accessioned2021-11-23T18:00:25Z
dc.date.available2021-11-23T18:00:25Z
dc.date.issued2021-08-12
dc.identifier.citationZENG QIBIN (2021-08-12). DEVELOPMENT OF ADVANCED MULTI-FREQUENCY SCANNING PROBE MICROSCOPIES FOR NANOSCALE PHYSICAL PROPERTIES CHARACTERIZATION. ScholarBank@NUS Repository.
dc.identifier.urihttps://scholarbank.nus.edu.sg/handle/10635/207619
dc.language.isoen
dc.subjectScanning probe microscopy, multi-frequency, piezoelectric and ferroelectric, surface strain, surface potential, nanoscale characterization
dc.typeThesis
dc.contributor.departmentMECHANICAL ENGINEERING
dc.contributor.supervisorKaiyang Zeng
dc.description.degreePh.D
dc.description.degreeconferredDOCTOR OF PHILOSOPHY (CDE-ENG)
dc.identifier.orcid0000-0001-9307-0830
Appears in Collections:Ph.D Theses (Closed)

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